• Chinese Journal of Quantum Electronics
  • Vol. 25, Issue 3, 346 (2008)
Xiang-dong LUO*
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    LUO Xiang-dong. Fractal surface of TiN thin films sputtered at different N2 flow ratios[J]. Chinese Journal of Quantum Electronics, 2008, 25(3): 346 Copy Citation Text show less
    References

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    [2] Kagiyama A,Terakado K,Urao R. Effect of nitride and TiN coating temperatures on the corrosion resistance of the combined surface modification layer [J].Surf. Coat. Technol.,2003,169-170: 397-400.

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    [5] Takahashi T,Masugata K,et al. Surface Morphology of TiN Films Reactively Deposited by Bias Sputtering [J].Vacuum,2000,59:777-784.

    [6] Ge S,Suo S. The Computation Methods for Fractal Dimension of Surface Profils [J].Trans Tribol,1997,17(4):354-362.

    [8] Fromin A A,Akhmator V. Magnetron Sputtering System Stabilization for High Rate Deposition of AIN Films Vacuum [J].Vacuum,1998,49(3): 247-251.

    [9] Aita C R,Gawlak C J. The Dependence of Alumium Nitride Films Crystallography on Sputtering Plasma Composition [J].J. Vac. Sci. Technol.,1983,Al(2): 402-406.

    [11] Styervoyedov A,Farenik V. Formation of Ti and TiN Ultra-thin Films on Si by Ion Beam Sputter Deposition [J].Surf. Sci.,2006,600: 3766-3769.

    LUO Xiang-dong. Fractal surface of TiN thin films sputtered at different N2 flow ratios[J]. Chinese Journal of Quantum Electronics, 2008, 25(3): 346
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