• Laser & Optoelectronics Progress
  • Vol. 52, Issue 7, 71204 (2015)
Liu Haijun*, Chen Xinlin, Xiao Guangzong, Zhou Jian, and Luo Hui
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/lop52.071204 Cite this Article Set citation alerts
    Liu Haijun, Chen Xinlin, Xiao Guangzong, Zhou Jian, Luo Hui. Particle′s Sub-Nanometer Displacement Measurement Based on the Back-Focal-Plane Method in Optical Trap[J]. Laser & Optoelectronics Progress, 2015, 52(7): 71204 Copy Citation Text show less
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    Liu Haijun, Chen Xinlin, Xiao Guangzong, Zhou Jian, Luo Hui. Particle′s Sub-Nanometer Displacement Measurement Based on the Back-Focal-Plane Method in Optical Trap[J]. Laser & Optoelectronics Progress, 2015, 52(7): 71204
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