Researching | Particle′s Sub-Nanometer Displacement Measurement Based on the Back-Focal-Plane Method in Optical Trap

Journals >Laser & Optoelectronics Progress >Volume 52 >Issue 7 >Page 71204 > Article

Laser & Optoelectronics Progress
Vol. 52, Issue 7, 71204 (2015)

Particle′s Sub-Nanometer Displacement Measurement Based on the Back-Focal-Plane Method in Optical Trap

Liu Haijun^*, Chen Xinlin, Xiao Guangzong, Zhou Jian, and Luo Hui

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DOI: 10.3788/lop52.071204 Cite this Article Set citation alerts

Liu Haijun, Chen Xinlin, Xiao Guangzong, Zhou Jian, Luo Hui. Particle′s Sub-Nanometer Displacement Measurement Based on the Back-Focal-Plane Method in Optical Trap[J]. Laser & Optoelectronics Progress, 2015, 52(7): 71204 Copy Citation Text

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Liu Haijun, Chen Xinlin, Xiao Guangzong, Zhou Jian, Luo Hui. Particle′s Sub-Nanometer Displacement Measurement Based on the Back-Focal-Plane Method in Optical Trap[J]. Laser & Optoelectronics Progress, 2015, 52(7): 71204

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