• Opto-Electronic Engineering
  • Vol. 36, Issue 4, 17 (2009)
CHEN Yan-fei*, SU Xian-yu, and DOU Yun-fu
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    CHEN Yan-fei, SU Xian-yu, DOU Yun-fu. Fast Modulation Measurement Profilometry Based on Double Color Projections[J]. Opto-Electronic Engineering, 2009, 36(4): 17 Copy Citation Text show less
    References

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    [8] SHAO Shuang-yun,SU Xian-yu,ZHANG Qi-can,et al. Complex object shape measurement using modulation measurement profilometry [J]. Acta Optica Sinica,2004,24(12):1623-1628.

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    CHEN Yan-fei, SU Xian-yu, DOU Yun-fu. Fast Modulation Measurement Profilometry Based on Double Color Projections[J]. Opto-Electronic Engineering, 2009, 36(4): 17
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