• Opto-Electronic Engineering
  • Vol. 36, Issue 4, 17 (2009)
CHEN Yan-fei*, SU Xian-yu, and DOU Yun-fu
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    CHEN Yan-fei, SU Xian-yu, DOU Yun-fu. Fast Modulation Measurement Profilometry Based on Double Color Projections[J]. Opto-Electronic Engineering, 2009, 36(4): 17 Copy Citation Text show less

    Abstract

    In order to solve the lower measurement efficiency in traditional modulation profilometry, a fast modulation profilometry is proposed based on double color projections. Two sine gratings through the different projections form color fringe on measured object surface, and pictures are gotten by color CCD. Own to arrangement in layers’ quality of color CCD, we separate fringes into two signals, and acquire the modulation distributions. Because the modulation ratio is one-to-one correspondence to the height of object, the object is reconstructed. The design method for project of experiment, the method for acquiring modulation, the result of experiment and the deviation analysis are proposed. Several factors are discussed which affect the measurement accuracy. The result proves that this method in measuring complex objects, such as the object with deep holes, is highly efficient, simple and greatly accurate.
    CHEN Yan-fei, SU Xian-yu, DOU Yun-fu. Fast Modulation Measurement Profilometry Based on Double Color Projections[J]. Opto-Electronic Engineering, 2009, 36(4): 17
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