Hongyi GE, Fei WANG, Yuying JIANG, Li LI, Yuan ZHANG, Keke JIA. Identification of wheat mold using terahertz images based on Broad Learning System[J]. Chinese Journal of Quantum Electronics, 2023, 40(3): 360

Search by keywords or author
- Chinese Journal of Quantum Electronics
- Vol. 40, Issue 3, 360 (2023)
Abstract

Set citation alerts for the article
Please enter your email address