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    Journals >Acta Optica Sinica >Volume 9 >Issue 11 >Page 1033 > Article
    • Acta Optica Sinica
    • Vol. 9, Issue 11, 1033 (1989)
    Ellipcometric measurement of biaxial single crystal films on biaxial crystal substrats
    SHI LUPING, JIANG MINHUA, SHAO ZHONGSHU, LIU YAOGANG, and WANG JITANG
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    SHI LUPING, JIANG MINHUA, SHAO ZHONGSHU, LIU YAOGANG, WANG JITANG. Ellipcometric measurement of biaxial single crystal films on biaxial crystal substrats[J]. Acta Optica Sinica, 1989, 9(11): 1033 Copy Citation Text show less
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    SHI LUPING, JIANG MINHUA, SHAO ZHONGSHU, LIU YAOGANG, WANG JITANG. Ellipcometric measurement of biaxial single crystal films on biaxial crystal substrats[J]. Acta Optica Sinica, 1989, 9(11): 1033
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