• Spectroscopy and Spectral Analysis
  • Vol. 40, Issue 10, 3066 (2020)
Hong-zhen ZHANG1,1,*, Ming-xia HE1,1, Li-li SHI1,1, and Peng-fei WANG1,1
Author Affiliations
  • 1[in Chinese]
  • 11. State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China
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    DOI: 10.3964/j.issn.1000-0593(2020)10-3066-05 Cite this Article
    Hong-zhen ZHANG, Ming-xia HE, Li-li SHI, Peng-fei WANG. Terahertz Thickness Measurement Based on Stochastic Optimization Algorithm[J]. Spectroscopy and Spectral Analysis, 2020, 40(10): 3066 Copy Citation Text show less
    References

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    [5] M Evans, K May R, S Zhong et al. Journal of Pharmaceutical Sciences, 100, 1535(2011).

    [7] T Iwata, Y Mizutani, H Uemura et al. Optics Express, 22, 20595(2014).

    [8] YC Shen, K Su, A Zeitler J. IEEE Transactions on Terahertz Science & Technology, 4, 432(2014).

    [9] M Akagi, Y Izutani, K Kitagishi. Measurements of Paint Thickness of Automobiles by Using THz Time-Domain Spectroscopy. International Conference on Infrared, Millimeter, and Terahertz Waves, IEEE(2012).

    [10] K Sawanaka, T Yasuda, T Yasui et al. Applied Optics, 44, 6849(2005).

    [12] T Nguyen D, W Volker, K Weber et al. Non-Destructive Measurement of Thickness and Refractive Index of Multilayer Coating on Metal Substrate. International Conference on Infrared, Millimeter, and Terahertz Waves, IEEE(2016).

    Hong-zhen ZHANG, Ming-xia HE, Li-li SHI, Peng-fei WANG. Terahertz Thickness Measurement Based on Stochastic Optimization Algorithm[J]. Spectroscopy and Spectral Analysis, 2020, 40(10): 3066
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