Hong-zhen ZHANG, Ming-xia HE, Li-li SHI, Peng-fei WANG. Terahertz Thickness Measurement Based on Stochastic Optimization Algorithm[J]. Spectroscopy and Spectral Analysis, 2020, 40(10): 3066
- Spectroscopy and Spectral Analysis
- Vol. 40, Issue 10, 3066 (2020)
Fig. 1. Principle of thickness determination by THz-TDS
(a): Model of coatings; (b): Times of flight of THz echoes
(a): Model of coatings; (b): Times of flight of THz echoes
Fig. 2. The measurement and simulation results of single coating samples
(a): Black coating sample; (b): Base coating sample
(a): Black coating sample; (b): Base coating sample
Fig. 3. Optical path error of the reflection pulse
Fig. 4. Reflection and simulation signals of the base and silver coating sample
Fig. 5. Paths of terahertz waves of a multi-layer sample
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Table 1. Results of single coating samples by SIN-EC770
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Table 2. Results of single coating samples by DE algorithm
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Table 3. Measurement errors (angle offset θ =1°)
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Table 4. Results of the double coating sample by terahertz method
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