• Journal of Semiconductors
  • Vol. 42, Issue 11, 112102 (2021)
Yuying Hu1、2, Chen Qiu1, Tao Shen1、2, Kaike Yang3, and Huixiong Deng1、2
Author Affiliations
  • 1State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
  • 2College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 100049, China
  • 3Key Laboratory of Low-Dimensional Quantum Structures and Quantum Control of Ministry of Education, Synergetic Innovation Center for Quantum Effects and Applications, Department of Physics, Hunan Normal University, Changsha 410081, China
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    DOI: 10.1088/1674-4926/42/11/112102 Cite this Article
    Yuying Hu, Chen Qiu, Tao Shen, Kaike Yang, Huixiong Deng. Direct calculations on the band offsets of large-lattice-mismatched and heterovalent Si and III–V semiconductors[J]. Journal of Semiconductors, 2021, 42(11): 112102 Copy Citation Text show less
    (Color online) Five steps for correcting the effect of lattice mismatch on valence band offset calculations using core energy levels as a reference.
    Fig. 1. (Color online) Five steps for correcting the effect of lattice mismatch on valence band offset calculations using core energy levels as a reference.
    (Color online) (a–e) show the five superlattice structures constructed. (a) Equilibrium-unidirectional superlattice of Si. (b) Unidirectional-bidirectional strain superlattice of Si. (c) Bidirectional strain superlattice of Si and InAs. (d) Bidirectional-unidirectional superlattice of InAs. (e) Unidirectional-equilibrium superlattice of InAs.
    Fig. 2. (Color online) (a–e) show the five superlattice structures constructed. (a) Equilibrium-unidirectional superlattice of Si. (b) Unidirectional-bidirectional strain superlattice of Si. (c) Bidirectional strain superlattice of Si and InAs. (d) Bidirectional-unidirectional superlattice of InAs. (e) Unidirectional-equilibrium superlattice of InAs.
    (Color online) The abrupt interface, mixed cation interface and mixed anion interface formed by Si and InAs along the [100] direction, and the corresponding potential distribution along the growth orientation of the superlattices.
    Fig. 3. (Color online) The abrupt interface, mixed cation interface and mixed anion interface formed by Si and InAs along the [100] direction, and the corresponding potential distribution along the growth orientation of the superlattices.
    (Color online) Band offset diagram of the Si/GaSb, Si/InAs and Si/InSb systems with zinc-blende structure along the [100], [110], and [111] directions. The energy is relative to the vacuum level of Si.
    Fig. 4. (Color online) Band offset diagram of the Si/GaSb, Si/InAs and Si/InSb systems with zinc-blende structure along the [100], [110], and [111] directions. The energy is relative to the vacuum level of Si.
    SystemLattice constantMismatch (%) [100][110] abrupt[111]Exp.\Theo.
    Mixed anionMixed cationAverageMixed anionMixed cationAverage
    i from Ref. [26]; ii from Ref. [28]; iii from Ref. [27]; iv from Ref. [29]; v from Ref. [30]; vi from Ref. [32]; vii from Ref. [31]; Viii from Ref. [13]; ix from Ref. [33].
    Si/AlP5.460.55–0.56–1.21–0.88–0.84–0.59–1.22–0.91–\–0.91i
    Si/AlAs5.664.24–0.07–0.70–0.39–0.260.05–0.53–0.24–\–
    Si/AlSb6.1413.080.310.260.280.520.370.410.39–\–
    Si/GaN4.53–16.57–1.92–1.99–1.95–2.00–1.52–1.68–1.60–1.90ii\–
    Si/GaP5.450.370.04–0.59–0.28–0.280.02–0.58–0.28–0.24±0.12iii\–0.27i
    Si/GaAs5.654.050.29–0.090.100.280.510.110.310.23±0.10iv \0.12v
    Si/GaSb6.1012.340.410.260.340.620.360.270.31–\–
    Si/InP5.878.100.10–0.27–0.080.250.430.070.250.12vi\0.36vii
    Si/InAs6.0611.600.290.110.200.420.420.370.400.31viii\0.50vii
    Si/InSb6.4819.340.160.140.150.730.220.240.230.06ix\0.25vii
    Table 1. Valence band offsets (in eV) of Si/III–V semiconductors with lattice mismatch and heterovalence along the orientation of [100], [110], [111], respectively. The lattice constants (in Å) of III–V semiconductors and mismatches (referred to the lattice constant of Si, e.g. 5.43 Å) are also given. The positive value represents that the position of the valence band of the III–V semiconductor is higher than that of Si.
    Yuying Hu, Chen Qiu, Tao Shen, Kaike Yang, Huixiong Deng. Direct calculations on the band offsets of large-lattice-mismatched and heterovalent Si and III–V semiconductors[J]. Journal of Semiconductors, 2021, 42(11): 112102
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