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    Journals >Acta Optica Sinica >Volume 16 >Issue 10 >Page 1493 > Article
    • Acta Optica Sinica
    • Vol. 16, Issue 10, 1493 (1996)
    Emittance Measurement of a High Brightness Pseudospark Produced Electron Beam
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Emittance Measurement of a High Brightness Pseudospark Produced Electron Beam[J]. Acta Optica Sinica, 1996, 16(10): 1493 Copy Citation Text show less
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Emittance Measurement of a High Brightness Pseudospark Produced Electron Beam[J]. Acta Optica Sinica, 1996, 16(10): 1493
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