Zhentang Zhao1、*, Dong Wang1, Lixin Yin1, Guoping Fang1, Qiang Gu1, Ming Gu1, Yongbin Leng1, Bo Liu1, Qiaogen Zhou1, Liren Shen1, Meng Zhang1, Haixiao Deng1, Jiahua Chen1, Jianhui Chen1, Zhihao Chen1, Jianguo Ding1, Wencheng Fang1, Chao Feng1, Duan Gu1, Xiao Hu1, Dazhang Huang1, Maomao Huang1, Zhiqiang Jiang1, Bin Li1, Guoqiang Lin1, Yiyong Liu1, Sen Sun1, Guanghong Wang1, Xingtao Wang1, Zhen Wang1, Yanqing Wu1, Luyang Yu1, Qibing Yuan1, Wei Zhang1, Shaopeng Zhong1, Xiaobin Xia2, Chuanxiang Tang3, Wenhui Huang3, Yingchao Du3, and Lixin Yan3
Author Affiliations
1Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China2Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China3Department of Engineering Physics, Tsinghua University, Beijing 100084, Chinashow less
DOI: 10.3788/AOS202141.0114006
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Zhentang Zhao, Dong Wang, Lixin Yin, Guoping Fang, Qiang Gu, Ming Gu, Yongbin Leng, Bo Liu, Qiaogen Zhou, Liren Shen, Meng Zhang, Haixiao Deng, Jiahua Chen, Jianhui Chen, Zhihao Chen, Jianguo Ding, Wencheng Fang, Chao Feng, Duan Gu, Xiao Hu, Dazhang Huang, Maomao Huang, Zhiqiang Jiang, Bin Li, Guoqiang Lin, Yiyong Liu, Sen Sun, Guanghong Wang, Xingtao Wang, Zhen Wang, Yanqing Wu, Luyang Yu, Qibing Yuan, Wei Zhang, Shaopeng Zhong, Xiaobin Xia, Chuanxiang Tang, Wenhui Huang, Yingchao Du, Lixin Yan. Shanghai Soft X-ray Free-Electron Laser Test Facility[J]. Acta Optica Sinica, 2021, 41(1): 0114006
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Fig. 1. SXFEL test facility in the SSRF campus
Fig. 2. Schematic layout of SXFEL test facility
Fig. 3. Schematic of the undulator system for HGHG cascade
Fig. 4. Gain curve and output spectra of 8.8 nm cascaded HGHG-FEL. (a) Gain curve; (b) output spectra
Fig. 5. Schematic of the undulator system for EEHG-HGHG cascade
Fig. 6. Gain curve and output spectra of the first stage EEHG. (a) Gain curve; (b) output spectra
Fig. 7. Second stage gain curve of EEHG-HGHG cascade
Fig. 8. Schematic of the undulator system for single stage EEHG
Fig. 9. Gain curve (20th harmonic) and radiation spot (30th harmonic) of single-stage EEHG. (a) Gain curve; (b) radiation spot
Fig. 10. Injector of the SXFEL test facility
Fig. 11. Laser heater. (a) Sketch; (b) physical photograph
Fig. 12. X-band linearizer
Fig. 13. Movable magnetic bunch compressor. (a) Sketch; (b) physical photograph
Fig. 14. Longitudinal phase space and current distribution of electron beam at the linac exit. (a) Without X-band linearizer; (b) with X-band linearizer
Fig. 15. C-band linac
Fig. 16. C-band deflecting cavity at the exit of the SXFEL linac and the measured longitudinal beam phase space distribution. (a) C-band deflecting cavity; (b) longitudinal beam phase space distribution
Fig. 17. U235 undulators installed in tunnel
Fig. 18. Cavity beam position monitor. (a) Photograph of the monitor; (b) resolution evaluation result
Fig. 19. X-band deflecting structures installed in the SXFEL test facility. (a) Photograph; (b) measured beam phase space when lasing
Fig. 20. High resolution X-ray spectrometer in diagnostic beam line. (a) Photograph; (b) measured spectrum
Fig. 21. Schematic of the SXFEL user facility
Component | Parameter | Design value | Measurement value |
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Injector | Bunch charge /nC | 0.5 | 0.52 | Beam energy /MeV | ~120 | 124.9 | Bunch length (FWHM) /ps | 8~10 | 9.44 | Normalized emittance /(mm·mrad) | ≤1.5 | 0.79(x)/0.96 (y) | Energy spread (RMS) /% | ≤0.14 | 0.069 | Repetition rate /Hz | 10 | 10 | Main linac | Beam Energy /GeV | 0.84 | 0.842 | Energy spread (RMS) /% | <0.15 | 0.094 | Normalized emittance /(mm·mrad) | ≤2.5 | 2.009(x)/1.434 (y) | Bunch length (FWHM) /ps | ≤1.0 | 0.71 | Bunch charge /nC | 0.5 | 0.525 | Peak current /A | ≥500 | 810 | Repetition rate /Hz | 10 | 10 |
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Table 1. Main parameters of the SXFEL linac
Parameter | Design value | Measurement value |
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Wavelength /nm | <9 | 8.87 | Peak power /MW | > 100 | 207 | Pulse width /fs | 100--200 | 69 | HGHG-HGHG cascading harmonics configuration | 6×5 | 6×5 | EEHG-HGHG cascading harmonics configuration | 6×5 | 6×5 |
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Table 2. Main FEL parameters of the SXFEL test facility
Undulator model | U235 | U40 | U55 | U80 |
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Period /mm | 23.5 | 40 | 55 | 80 | Gap control precision /μm | <3 | <3 | <3 | <3 | Peak field /T | 0.65 | 0.85 | 0.70 | 0.78 | First-order integral error /(Gs·cm) | <50 | <50 | <50 | <50 | Second-order integral error /(Gs·cm2) | <3000 | <3000 | <3000 | <3000 | Orbit straightness (RMS) /μm | <5 | <10 | <10 | <10 | Phase error /(°) | <5 | <5 | <5 | <5 | Length /m | 3 | 3 | 1.5 | 1.5 |
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Table 3. Undulator parameters in the SXFEL test facility
Parameter | Design value | Measurement value |
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Central wavelength /nm | 266 | 266 | Peak power /MW | >100 | 448 | Pulse width (FWHM) /fs | ~150 | 161 |
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Table 4. Seed laser parameters in the SXFEL test facility
Parameter | Monitor type | Specification |
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Beam position | Cavity BPM | <1 μm@500 pC±500 μm DR | Beam profile | YAG/OTR | Resolution: 20 μmPositioning accuracy: 50 μm@0.5 nC | Bunch charge | ICT | <1% @500 pC | FEL pulse length | Deflecting structure | X-band, ~15 fs resolution | FEL pulse profile | Fluorescence screen | Resolution: 20 μm | FEL spectrum | Spectrograph | 5--10 nm, resolution >5000 |
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Table 5. Beam and optical diagnostic systems and their main parameters at undulator section
Parameter | Seeded FEL line SASE line |
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Beam energy /GeV | 1.5 | Energy spread (RMS) /% | ≤0.1 | Normalized emittance /(mm·mrad) | ≤1.5 | Peak current /A | ≥700 | FEL operation mode | External seeding | SASE | Seed laser wavelength /nm | 240--360 | / | FEL output wavelength /nm | 3--20 | 2--10 | FEL output peak power /MW | ≥100 | ≥100 | FEL output pulse width (FWHM) /fs | ~50 | ~100 |
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Table 6. Design parameters of the SXFEL user facility