• Laser & Optoelectronics Progress
  • Vol. 59, Issue 13, 1304001 (2022)
Yiyun Yan1, Yunsheng Qian1、*, Jingzhi Zhang1, Kun Han2, Zhou Zheng2, and Lei Liu1
Author Affiliations
  • 1School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, Jiangsu , China
  • 2Science and Technology on Low-Light-Level Night Vision Laboratory, Xi’an 710065, Shaanxi , China
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    DOI: 10.3788/LOP202259.1304001 Cite this Article Set citation alerts
    Yiyun Yan, Yunsheng Qian, Jingzhi Zhang, Kun Han, Zhou Zheng, Lei Liu. Design of Spectral Response Test System for Electron Bombardment Active Pixel Sensor[J]. Laser & Optoelectronics Progress, 2022, 59(13): 1304001 Copy Citation Text show less
    Basic structure of the EBAPS
    Fig. 1. Basic structure of the EBAPS
    Schematic diagram of the EBAPS spectral response test
    Fig. 2. Schematic diagram of the EBAPS spectral response test
    Physical image of the EBAPS spectral response test
    Fig. 3. Physical image of the EBAPS spectral response test
    Program interface of the test system
    Fig. 4. Program interface of the test system
    Spectral response curve obtained by EBAPS
    Fig. 5. Spectral response curve obtained by EBAPS
    Spectral response curves measured under different high voltage
    Fig. 6. Spectral response curves measured under different high voltage
    No.12345
    Value3.23×1083.17×1083.20×1083.19×1083.21×108
    Table 1. Integral sensitivity of the EBAPS
    Yiyun Yan, Yunsheng Qian, Jingzhi Zhang, Kun Han, Zhou Zheng, Lei Liu. Design of Spectral Response Test System for Electron Bombardment Active Pixel Sensor[J]. Laser & Optoelectronics Progress, 2022, 59(13): 1304001
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