• Laser & Optoelectronics Progress
  • Vol. 59, Issue 13, 1304001 (2022)
Yiyun Yan1, Yunsheng Qian1、*, Jingzhi Zhang1, Kun Han2, Zhou Zheng2, and Lei Liu1
Author Affiliations
  • 1School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, Jiangsu , China
  • 2Science and Technology on Low-Light-Level Night Vision Laboratory, Xi’an 710065, Shaanxi , China
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    DOI: 10.3788/LOP202259.1304001 Cite this Article Set citation alerts
    Yiyun Yan, Yunsheng Qian, Jingzhi Zhang, Kun Han, Zhou Zheng, Lei Liu. Design of Spectral Response Test System for Electron Bombardment Active Pixel Sensor[J]. Laser & Optoelectronics Progress, 2022, 59(13): 1304001 Copy Citation Text show less

    Abstract

    An electron-bombarded active pixel sensor (EBAPS) is a type of vacuum-solid hybrid low light-level device that encapsulates a photocathode, an electronic-sensitive active pixel sensor (APS) chip, and a base, using vacuum technology. Integral sensitivity is a crucial performance parameter of EBAPS, but corresponding test methods in China are lacking. Therefore, based on the working principle of EBAPS and the spectral response test method of a low-light level-image intensifier, the spectral responsivity is characterized by a digital-electron conversion factor and the number of electrons obtained from the output signal in this study. Moreover, a spectral response test system of EBAPS is designed. The spectral response curves of EBAPS at an operating voltage of -800 V are obtained using this system. The EBAPS’ integral sensitivity is 3.2 × 108 (s·lm)-1, and repeatability is 0.65%.
    Yiyun Yan, Yunsheng Qian, Jingzhi Zhang, Kun Han, Zhou Zheng, Lei Liu. Design of Spectral Response Test System for Electron Bombardment Active Pixel Sensor[J]. Laser & Optoelectronics Progress, 2022, 59(13): 1304001
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