High-Precision Measurement of Mid-Infrared Waveplate Phase Retardation Based on Dual Photoelastic Difference Frequency Modulation

Rui Zhang; Yuanyuan Chen; Ning Jing; Zhibin Wang; Kewu Li; Kunyang Xie

doi:10.3788/AOS201939.0312002

Journals >Acta Optica Sinica >Volume 39 >Issue 3 >Page 0312002 > Article

Acta Optica Sinica
Vol. 39, Issue 3, 0312002 (2019)

High-Precision Measurement of Mid-Infrared Waveplate Phase Retardation Based on Dual Photoelastic Difference Frequency Modulation

Rui Zhang^{1、2、3、*}, Yuanyuan Chen^1、2、3, Ning Jing^1、2、3, Zhibin Wang^1、2、3, Kewu Li^1、2、3, and Kunyang Xie^1、2、3

Author Affiliations

¹ Engineering and Technology Research Center of Shanxi Province for Optical-Electric Information and Instrument, North University of China, Taiyuan, Shanxi 0 30051, China

² Key Laboratory of Instrument Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan, Shanxi 0 30051, China;

³ State Key Laboratory for Electronic Measurement Technology, North University of China, Taiyuan, Shanxi 0 30051, China

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DOI: 10.3788/AOS201939.0312002 Cite this Article Set citation alerts

Rui Zhang, Yuanyuan Chen, Ning Jing, Zhibin Wang, Kewu Li, Kunyang Xie. High-Precision Measurement of Mid-Infrared Waveplate Phase Retardation Based on Dual Photoelastic Difference Frequency Modulation[J]. Acta Optica Sinica, 2019, 39(3): 0312002 Copy Citation Text

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References