• Acta Optica Sinica
  • Vol. 28, Issue 12, 2307 (2008)
Zhang Chengyi*, Li Chuanqi, and Pei Shixin
Author Affiliations
  • [in Chinese]
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    Zhang Chengyi, Li Chuanqi, Pei Shixin. Theoretical Study of Arbitrary Step-Height Measurement Based on Wavelength-Scanning Talbot Effect[J]. Acta Optica Sinica, 2008, 28(12): 2307 Copy Citation Text show less
    References

    [1] Satish Kumar Dubey, Dalip Singh Mehta, Amitava Roy et al.. Wavelength-scanning Talbot effect and its application for arbitrary three-dimensional step height measurement[J] . Opt. Commun., 2007, 279: 13~19

    [2] Dalip Singh Mehta, Satish Kumar Dubey, Chandra Shakher et al.. Two-wavelength Talbot effect and its application for three dimensional step-height measurement[J]. Appl. Opt., 2006, 45: 7602~7609

    [3] Hou Changlun, Bai Jian, Hou Xiyun et al.. The accurate measurement of angle based on Talbot effect of Ronchi grating[J]. Optical Instruments, 2004, 26(1): 11~14

    [4] Ding Jiansheng. Measurement of long focal length by using the Talbot effect and Moiré technique[J]. Opto-Electronic Engineering, 1994, 21(1): 53~57

    [5] Huaisheng Wang. To measure chirped ultrashort laser pulse by the Talbot effect of a grating[J]. Opt. Commun., 2006, 259: 107~109

    [6] Zhang Chengyi, Tao Chunkan. A imaging approach of two-dimensional object with subwavelength periodic structure based on moiré technique [J]. Acta Optica Sinica, 2007, 27(11): 1967~1972

    [7] Zhang Chengyi, Tao Chunkan. Photonics study on imaging of one-dimensional periodic object with subwavelength structure[J]. Acta Optica Sinica, 2006, 26(11): 1651~1656

    [8] Eugenio Garbusi, Jose A. Ferrari. Defect enhancement in periodic masks using 1/2-Talbot effect[J]. Opt. Commun., 2006, 259: 55~59

    [9] Wang Shifan. Theory and Practice on Information Optics[M]. Beijing: Beijing University of Posts and Telecommunications Press, 2004. 73~76

    [10] Max Born, Emil Wolf. Principles of Optics[M]. 7th ed., Cambridge,1999. 456~458

    Zhang Chengyi, Li Chuanqi, Pei Shixin. Theoretical Study of Arbitrary Step-Height Measurement Based on Wavelength-Scanning Talbot Effect[J]. Acta Optica Sinica, 2008, 28(12): 2307
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