• Journal of Semiconductors
  • Vol. 44, Issue 8, 082702 (2023)
Yuheng Zeng1,2,3,†,*, Zetao Ding1,2,3,†, Zunke Liu1,2,3..., Wei Liu1,3, Mingdun Liao1,3, Xi Yang1,2,3, Zhiqin Ying1,3, Jingsong Sun1,3, Jiang Sheng1,2,3, Baojie Yan1,2,3, Haiyan He4, Chunhui Shou4, Zhenhai Yang1,3,** and Jichun Ye1,2,3,***|Show fewer author(s)
Author Affiliations
  • 1Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
  • 3Zhejiang Engineering Research Center for Energy Optoelectronic Materials and Devices, Ningbo Institute of Materials Technology & Engineering, CAS, Ningbo 315201, China
  • 4Zhejiang Energy Group R & D, Hangzhou 310003, China
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    DOI: 10.1088/1674-4926/44/8/082702 Cite this Article
    Yuheng Zeng, Zetao Ding, Zunke Liu, Wei Liu, Mingdun Liao, Xi Yang, Zhiqin Ying, Jingsong Sun, Jiang Sheng, Baojie Yan, Haiyan He, Chunhui Shou, Zhenhai Yang, Jichun Ye. Efficiency-loss analysis of monolithic perovskite/silicon tandem solar cells by identifying the patterns of a dual two-diode model’s current-voltage curves[J]. Journal of Semiconductors, 2023, 44(8): 082702 Copy Citation Text show less
    (Color online) (a) Schematic diagram and (b) diode model of the perovskite/Si tandem solar cell. Note that a well-fabricated intermediate junction is considered as a resistor; alternatively, an improperly prepared intermediate junction is considered as a Schottky junction.
    Fig. 1. (Color online) (a) Schematic diagram and (b) diode model of the perovskite/Si tandem solar cell. Note that a well-fabricated intermediate junction is considered as a resistor; alternatively, an improperly prepared intermediate junction is considered as a Schottky junction.
    (Color online) (a) Illuminated J-V curves, (b) dark J-V curves of the 24% Si solar cell, 19% PVS solar cell, and 28.5% PVS/Si tandem solar cell, which parameters listed in Table 1 are extracted from the reported Si and perovskite solar cells. (c) Semi-log dark J-V curves and (d) m-V curves of the 28.5% PVS/Si tandem solar cell and the individual branches from the diode models.
    Fig. 2. (Color online) (a) Illuminated J-V curves, (b) dark J-V curves of the 24% Si solar cell, 19% PVS solar cell, and 28.5% PVS/Si tandem solar cell, which parameters listed in Table 1 are extracted from the reported Si and perovskite solar cells. (c) Semi-log dark J-V curves and (d) m-V curves of the 28.5% PVS/Si tandem solar cell and the individual branches from the diode models.
    (Color online) Illuminated J-V curves of the PVS/Si tandem cells whose efficiency loss is originated from the different Si subcell’s Voc-loss mechanisms, i.e., (a) I01_Si and (b) I02_Si, respectively. Effects of I01_Si and I02_Si on (c) the efficiency, (d) the Voc, (e) the FF, (f) the semi-log dark I-V curves, and (g) the m-V curves of the tandem cells.
    Fig. 3. (Color online) Illuminated J-V curves of the PVS/Si tandem cells whose efficiency loss is originated from the different Si subcell’s Voc-loss mechanisms, i.e., (a) I01_Si and (b) I02_Si, respectively. Effects of I01_Si and I02_Si on (c) the efficiency, (d) the Voc, (e) the FF, (f) the semi-log dark I-V curves, and (g) the m-V curves of the tandem cells.
    (Color online) Illuminated J-V curves of the PVS/Si tandem cells with different shunt resistances originated from (a) the full cell, (b) the Si subcell, or (c) the PVS subcell. The shunt resistance values are set as 100000, 5000, 1000, 500, and 100 Ω.cm2, representing different degrees of leakage. The semi-log dark J-V curve comparison (d) and m-V curve comparison (e) of the three cells with shunt resistances of 1000 and 100 Ω.cm2.
    Fig. 4. (Color online) Illuminated J-V curves of the PVS/Si tandem cells with different shunt resistances originated from (a) the full cell, (b) the Si subcell, or (c) the PVS subcell. The shunt resistance values are set as 100000, 5000, 1000, 500, and 100 Ω.cm2, representing different degrees of leakage. The semi-log dark J-V curve comparison (d) and m-V curve comparison (e) of the three cells with shunt resistances of 1000 and 100 Ω.cm2.
    (Color online) (a) Schematic diagrams of the Ohmic-contact intermediate junction. Effects of the intermediate junction with different resistances on (b) the illuminated J-V curves, (c) the Voc and FF, (d) the semi-log dark J-V curves, and (e) the m-V curves.
    Fig. 5. (Color online) (a) Schematic diagrams of the Ohmic-contact intermediate junction. Effects of the intermediate junction with different resistances on (b) the illuminated J-V curves, (c) the Voc and FF, (d) the semi-log dark J-V curves, and (e) the m-V curves.
    (Color online) (a) Schematic diagrams of the Schottky-contact intermediate junction. Effects of the intermediate junction with different saturation current densities on (b) the illuminated J-V curves, (c) the Voc and FF, (d) the semi-log dark J-V curves, and (e) the m-V curves.
    Fig. 6. (Color online) (a) Schematic diagrams of the Schottky-contact intermediate junction. Effects of the intermediate junction with different saturation current densities on (b) the illuminated J-V curves, (c) the Voc and FF, (d) the semi-log dark J-V curves, and (e) the m-V curves.
    600 mV640 mV670 mV700 mV730 mV
    I01_Si (A/cm2)3.4×10−127×10−142.2×10−136×10−142×10−14
    I02_Si (A/cm2)3.7×10−71.6×10−77.2×10−85×10−91×10−11
    Table 0. The setting I01_Si and I02_Si values of the Si subcells.
    I01 (A/cm2)I02 (A/cm2)Rsh .cm2)Rs .cm2)JL/Jsc (mA/cm2)Voc (mV)FF (%)PCE (%)MPP (mV)
    Si subcell6×10−145×10−91×1050.241.570282.024.0608
    PVS subcell1×10−211×10−113×1030.421.5109680.019.0943
    Junction0.01
    Tandem1×1050.119.5178182.028.51535
    Table 0. Default parameters used for the tandem solar cell.
    Yuheng Zeng, Zetao Ding, Zunke Liu, Wei Liu, Mingdun Liao, Xi Yang, Zhiqin Ying, Jingsong Sun, Jiang Sheng, Baojie Yan, Haiyan He, Chunhui Shou, Zhenhai Yang, Jichun Ye. Efficiency-loss analysis of monolithic perovskite/silicon tandem solar cells by identifying the patterns of a dual two-diode model’s current-voltage curves[J]. Journal of Semiconductors, 2023, 44(8): 082702
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