• Chinese Journal of Lasers
  • Vol. 19, Issue 10, 785 (1992)
[in Chinese] and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese]. Measurement of thickness and index of refraction of transparent medium[J]. Chinese Journal of Lasers, 1992, 19(10): 785 Copy Citation Text show less
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    [in Chinese], [in Chinese]. Measurement of thickness and index of refraction of transparent medium[J]. Chinese Journal of Lasers, 1992, 19(10): 785
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