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Journals >Chinese Journal of Lasers >Volume 19 >Issue 10 >Page 785 > Article

Chinese Journal of Lasers
Vol. 19, Issue 10, 785 (1992)

Measurement of thickness and index of refraction of transparent medium

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[in Chinese], [in Chinese]. Measurement of thickness and index of refraction of transparent medium[J]. Chinese Journal of Lasers, 1992, 19(10): 785 Copy Citation Text

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Abstract

By means of laser speckle photography, the speckle displacement caused by refra ction in transparent medium is measured. The thickness and the index of refraction is then calcu lated. The measured range is wide and the thickness precision is up to the level of micrometer.

Keywords

laser speckle photography

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[in Chinese], [in Chinese]. Measurement of thickness and index of refraction of transparent medium[J]. Chinese Journal of Lasers, 1992, 19(10): 785

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