• Opto-Electronic Engineering
  • Vol. 34, Issue 6, 44 (2007)
[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Numerical simulation of infrared nondestructive testing based on transient heating with high energy[J]. Opto-Electronic Engineering, 2007, 34(6): 44 Copy Citation Text show less
    References

    [1] HSIEH C K,SU K U.A methodology of predicting cavity geometry based on scanned surface temperature data-prescribed surface temperature at the cavity side[J].ASME Journal of Heat Transfer,1980,102:324-329.

    [2] S.Sahnoun,S.Belattar.Thermal non destructive testing study of a circular defect in plane structure[J].British Journal of NDT,2003,8(8):115-121.

    [3] SAKAGAMI T,KUBO S.Applications of pulse heating thermography and lock-in thermography to quantitative nondestructive evaluations[J].Infrared Physics & Technology,2002,43:211-218.

    [4] MAIERHOFER CH,RELLIG M,RELLIG M.Transient thermography for structural investigation of concrete and composites in the near surface region[J].Infrared Physics & Technology,2002,43:271-278.

    [5] Patrick O.MOORE.Infrared and Thermal Testing-Nondestructive Testing Handbook (third edition:Volume 3)[M].USA:the American Society for Nondestructive,2001.

    [14] INAGAKI T,ISHII T,IWAMOTO T.On the NDT and E for the diagnosis of defects using infrared thermography[J].NDT&E International,1999,32:247-257.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Numerical simulation of infrared nondestructive testing based on transient heating with high energy[J]. Opto-Electronic Engineering, 2007, 34(6): 44
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