A reflective metasurface filter is proposed in this paper, which consists of a substrate, a nanograting with low refractive index, a Ag grating and a high-refractive-index dielectric SiN_x layer. The simulation results show that with the incident angle of 45°, the reflection peak appears at the wavelength of 475 nm for the plane perpendicular to the grating line, while it is located at 550 nm for the plane parallel to the grating line. The electric field distribution characteristics demonstrate that for different incident planes, transverse electric field-polarized incidence excites guided-mode resonance in different areas, and the intensity of guided-mode resonance is different from that of surface plasmon resonance in the case of transverse magnetic field-polarized incidence. As a result, different colors are present in the two planes perpendicular to and parallel to the grating line, respectively. Accordingly, the fabricated metasurface sample has significantly optical variable color, which can be flexibly realized for large-area structures by nanoimprint lithography. The proposed reflective metasurface filter has a broad application prospect in the fields of anti-counterfeiting and information encoding.