• Microelectronics
  • Vol. 52, Issue 3, 503 (2022)
ZOU Zhenxing1, ZHANG Zhenyue1, WANG Jianfeng1, ZHU Sixiong1, and CAO Jiali2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.13911/j.cnki.1004-3365.210343 Cite this Article
    ZOU Zhenxing, ZHANG Zhenyue, WANG Jianfeng, ZHU Sixiong, CAO Jiali. Simulation Study on Thermal Fatigue Life of Microcoil Spring CCGA Solder Column Under Temperature Cycle[J]. Microelectronics, 2022, 52(3): 503 Copy Citation Text show less
    References

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    [14] DARVEAUX R. Effect of simulation methodology on solder joint crack growth correlation and fatigue life prediction [J]. Trans American Soc Mechan Engineer, 2002, 124(9): 116-122.

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    [17] PERKINS A, SITARAMAN S K. Thermo-mechanical failure comparison and evaluation of CCGA and ABGA electronic package [C]// Electronic Compon Techn Conf. Seattle, WA, USA. 2003: 422-430.

    [19] DARVEAUX R. Effect of simulation methodology on solder joint crack growth correlation and fatigue life prediction [J]. J Electronic Packag, 2002, 124(3): 147-154.

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    [21] STRICKLAN S M, HESTER J D, GOWAN A K, et al. Microcoil spring interconnects for ceramic grid array integrated circuits [Z]. NASA Tech Memorandum, 2011.

    ZOU Zhenxing, ZHANG Zhenyue, WANG Jianfeng, ZHU Sixiong, CAO Jiali. Simulation Study on Thermal Fatigue Life of Microcoil Spring CCGA Solder Column Under Temperature Cycle[J]. Microelectronics, 2022, 52(3): 503
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