• Journal of Infrared and Millimeter Waves
  • Vol. 39, Issue 2, 221 (2020)
Merdan TUHTASUN1, Chen-Fang FAN1, Xiao-Wen LI1, Hui SHI1、*, and Feng LIU1、2
Author Affiliations
  • 1Department of Physics, Shanghai Normal University, Shanghai200234, China
  • 2Key Laboratory for Astrophysics, Shanghai Normal University, Shanghai0034, China
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    DOI: 10.11972/j.issn.1001-9014.2020.02.009 Cite this Article
    Merdan TUHTASUN, Chen-Fang FAN, Xiao-Wen LI, Hui SHI, Feng LIU. Infrared optical properties of one-dimensional 4H-SiC gratings and its nano-ruler application[J]. Journal of Infrared and Millimeter Waves, 2020, 39(2): 221 Copy Citation Text show less
    (a) Schematics of SiC grating structure and definitions of geometric parameters, and (b) CST-simulated infrared spectrum of 4H-SiC grating(red) and 4H-SiC substrate(black)
    Fig. 1. (a) Schematics of SiC grating structure and definitions of geometric parameters, and (b) CST-simulated infrared spectrum of 4H-SiC grating(red) and 4H-SiC substrate(black)
    The evolution of electric-field distribution of the four optical modes
    Fig. 2. The evolution of electric-field distribution of the four optical modes
    CST-simulated infrared spectrum of one-dimensional 4H-SiC grating structure with varying structural parameters
    Fig. 3. CST-simulated infrared spectrum of one-dimensional 4H-SiC grating structure with varying structural parameters
    Calculated energy band structures for 4H-SiC gratings with different periodicities 8.7 μm(black), 9.0 μm(red), 9.3 μm(blue), 9.6 μm(purple)
    Fig. 4. Calculated energy band structures for 4H-SiC gratings with different periodicities 8.7 μm(black), 9.0 μm(red), 9.3 μm(blue), 9.6 μm(purple)
    (a) SEM image of fabricated 4H-SiC grating,(b) FTIR spectroscopy of the 4H-SiC grating,(c)-(f) the measured IR spectroscopy of the 4H-SiC grating with changing parameter
    Fig. 5. (a) SEM image of fabricated 4H-SiC grating,(b) FTIR spectroscopy of the 4H-SiC grating,(c)-(f) the measured IR spectroscopy of the 4H-SiC grating with changing parameter
    The IR spectroscopy of SiC grating deposited by Al2O3(a) HfO2(b) with various thicknesses. The linear relation between the change of the thickness of Al2O3(c) HfO2(d) and the offset of the PSPhPs peak position
    Fig. 6. The IR spectroscopy of SiC grating deposited by Al2O3(a) HfO2(b) with various thicknesses. The linear relation between the change of the thickness of Al2O3(c) HfO2(d) and the offset of the PSPhPs peak position
    Merdan TUHTASUN, Chen-Fang FAN, Xiao-Wen LI, Hui SHI, Feng LIU. Infrared optical properties of one-dimensional 4H-SiC gratings and its nano-ruler application[J]. Journal of Infrared and Millimeter Waves, 2020, 39(2): 221
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