• Infrared and Laser Engineering
  • Vol. 49, Issue 4, 0418002 (2020)
Kai Qiao1、2, Shengkai Wang1、2, Hongchang Cheng1、2, Chuan Jin1、2, Taimin Zhang1、2, Xiaojun Yang1、2, and Bin Ren1、2
Author Affiliations
  • 1Science and Technology on Low-Light-Level Night Vision Laboratory, Xi'an 710065, China
  • 2Kunming Institute of Physics, Kunming 650223, China
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    DOI: 10.3788/IRLA202049.0418002 Cite this Article
    Kai Qiao, Shengkai Wang, Hongchang Cheng, Chuan Jin, Taimin Zhang, Xiaojun Yang, Bin Ren. Experimental study on the electron sensitivity of BCMOS sensor influenced by surface passivation film[J]. Infrared and Laser Engineering, 2020, 49(4): 0418002 Copy Citation Text show less
    System of vacuum electron bombardment test
    Fig. 1. System of vacuum electron bombardment test
    Principle of electron multiplication
    Fig. 2. Principle of electron multiplication
    Electron bombardment response curve
    Fig. 3. Electron bombardment response curve
    Electron bombardment response curve of BCMOS with Al2O3 film of different thickness
    Fig. 4. Electron bombardment response curve of BCMOS with Al2O3 film of different thickness
    Response energy corresponding to different thin film thickness
    Fig. 5. Response energy corresponding to different thin film thickness
    Increasing percentage of the multiplier electron collection efficiency varies with the film thickness
    Fig. 6. Increasing percentage of the multiplier electron collection efficiency varies with the film thickness
    Effect of energy band distribution on secondary electron collection before and after passivation
    Fig. 7. Effect of energy band distribution on secondary electron collection before and after passivation
    Average dark current of BCMOS sensor under different conditions
    Fig. 8. Average dark current of BCMOS sensor under different conditions
    Kai Qiao, Shengkai Wang, Hongchang Cheng, Chuan Jin, Taimin Zhang, Xiaojun Yang, Bin Ren. Experimental study on the electron sensitivity of BCMOS sensor influenced by surface passivation film[J]. Infrared and Laser Engineering, 2020, 49(4): 0418002
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