• Acta Optica Sinica
  • Vol. 29, Issue 12, 3409 (2009)
Zhao Man1、*, Li Jian2, Wang Xiaojuan1, Zhou Maiyu1, Bao Jinhe1, and Gu Feng1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/aos20092912.3409 Cite this Article Set citation alerts
    Zhao Man, Li Jian, Wang Xiaojuan, Zhou Maiyu, Bao Jinhe, Gu Feng. The Properties of GaN Schottky Photodetectors[J]. Acta Optica Sinica, 2009, 29(12): 3409 Copy Citation Text show less
    References

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    [9] J. C. Carrano,T. Li,P. A. Grudowski et al.. High quantum efficiency metal-semiconductor-metal ultraviolet photodetectors fabricated on single-crystal GaN epitaxial layers[J]. Electron. Lett.,1997,33(23):1980-1981

    [10] P. Kung,D. Walker,P. Sandvik et al.. Schottky MSM photodetectors on GaN films grown on sapphire by lateral epitaxial overgrowth[C]. SPIE,1999,3629:223-229

    [11] T. Li,D. J. H. Lambert,A. L. Beck et al.. Low noise solar-blind AlxGa1-xN based metal-semiconductor-metal ultraviolet photodetectors[J]. J. Electron Materials,2001,30(7):872-877

    [12] B. Yang,D. J. H. Lambert,T. Li et al.. High-performance back-illuminated solar-blind AlGaN metal-semiconductor-metal photodetectors[J]. Electron. Lett.,2000,36(22):1866-1867

    [13] A. Soltani,H. A. Barkad,M. Mattalah et al.. 193 nm deep-ultraviolet solar-blind cubic boron nitride based photodetectors[J]. Appl. Phys. Lett.,2008,92(5):053501

    [14] J. C. Carrano,P. A. Grudowski,C. J. Eiting et al.. Very low dark current metal-semiconductor-metal ultraviolet photodetectors fabricated on single-crystal GaN epitaxial layers[J]. Appl. Phys. Lett.,1997,70(15):1992-1994

    [15] L. B. Flannery,I. Harrison,D. E. Lacklison et al.. Fabrication and characterization of p-type GaN metal-semiconductor-metal ultraviolet photoconductors grown by MBE[J]. Materials Science and Engineering B,1997,50(1):307-310

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    Zhao Man, Li Jian, Wang Xiaojuan, Zhou Maiyu, Bao Jinhe, Gu Feng. The Properties of GaN Schottky Photodetectors[J]. Acta Optica Sinica, 2009, 29(12): 3409
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