• Journal of Infrared and Millimeter Waves
  • Vol. 36, Issue 2, 208 (2017)
HOU Zhi-Jin1、2、3、*, FU Li11, SI Jun-Jie2、3, WANG Wei2、3, LV Yan-Qiu2、3, LU Zheng-Xiong2、3, and WANG Jin-Chun2、3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.11972/j.issn.1001-9014.2017.02.014 Cite this Article
    HOU Zhi-Jin, FU Li1, SI Jun-Jie, WANG Wei, LV Yan-Qiu, LU Zheng-Xiong, WANG Jin-Chun. Identification and orientation of connected defective elements in FPA[J]. Journal of Infrared and Millimeter Waves, 2017, 36(2): 208 Copy Citation Text show less
    References

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    [3] Rogalski A. Infrared detectors[M]. CRC Press, Taylor & Francis Group, Boca Raton, London, New York, 2011.

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    [11] Littler C. Characterization of impurities and defects in InSb and HgCdTe using novel magneto-optical techniques[J]. Proc. of SPIE, 1993, 2021:184-201.

    [12] Davis M, Greiner M. Indium antimonide large-format detector arrays[J]. Optical Engineering, 2011, 50(6):061016.

    [13] Rawe R, Martin C, Garter M, et al. Novel high fill-factor, small pitch, reticulated InSb IR FPA design[J]. Proc. of SPIE, 2005:5783.

    HOU Zhi-Jin, FU Li1, SI Jun-Jie, WANG Wei, LV Yan-Qiu, LU Zheng-Xiong, WANG Jin-Chun. Identification and orientation of connected defective elements in FPA[J]. Journal of Infrared and Millimeter Waves, 2017, 36(2): 208
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