It is difficult to identify connected defective elements by FPA test-bench because the response voltage of connected defective elements is basically the same as that of normal pixels. In this paper identification and orientation of connected defective elements in focal plane array (FPA) are presented. According to the characteristics of connected defective elements, we proposed a novel method which realizes the identification and orientation of connected defective elements by measuring the response voltage of detectors. Results show that the response voltage of detector can be divided into two sections by using the proposed method. The response voltage of connected defective elements is average of corresponding response voltage of the two sections. The test data is analyzed by MATLAB software and the particular information of connected defective elements such as number, shape and location is shown. The connected defective elements are identified and orientated markedly by the technique. Our study presents a crucial step for testing and evaluating FPA.