Researching | Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging

Journals >Chinese Optics Letters >Volume 17 >Issue 12 >Page 121103 > Article

Chinese Optics Letters
Vol. 17, Issue 12, 121103 (2019)

Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging

Zhiyuan Gu, Xianghui Wang^*, Jianxin Wang, Fei Fan, and Shengjiang Chang

Author Affiliations

Institute of Modern Optics, Tianjin Key Laboratory of Optoelectronic Sensor and Sensing Network Technology, Nankai University, Tianjin 300350, China

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DOI: 10.3788/COL201917.121103 Cite this Article Set citation alerts

Zhiyuan Gu, Xianghui Wang, Jianxin Wang, Fei Fan, Shengjiang Chang. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging[J]. Chinese Optics Letters, 2019, 17(12): 121103 Copy Citation Text

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Zhiyuan Gu, Xianghui Wang, Jianxin Wang, Fei Fan, Shengjiang Chang. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging[J]. Chinese Optics Letters, 2019, 17(12): 121103

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