Researching | Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging

Journals >Chinese Optics Letters >Volume 17 >Issue 12 >Page 121103 > Article

Chinese Optics Letters
Vol. 17, Issue 12, 121103 (2019)

Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging

Zhiyuan Gu, Xianghui Wang^*, Jianxin Wang, Fei Fan, and Shengjiang Chang

Author Affiliations

Institute of Modern Optics, Tianjin Key Laboratory of Optoelectronic Sensor and Sensing Network Technology, Nankai University, Tianjin 300350, China

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DOI: 10.3788/COL201917.121103 Cite this Article Set citation alerts

Zhiyuan Gu, Xianghui Wang, Jianxin Wang, Fei Fan, Shengjiang Chang. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging[J]. Chinese Optics Letters, 2019, 17(12): 121103 Copy Citation Text

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Diagram of 4pi focusing configuration. The lateral and axial directions are denoted by the r axis and z axis, respectively.

Fig. 1. Diagram of 4pi focusing configuration. The lateral and axial directions are denoted by the

r

axis and

z

axis, respectively.

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Calculated PSF profiles (a) in the transverse direction and (b) in the axial direction for the RP‐LG1,1 beam, RP beam, circularly polarized beam, and x-axis linearly polarized beam, respectively. The peak intensities have been normalized to one.

Fig. 2. Calculated PSF profiles (a) in the transverse direction and (b) in the axial direction for the

RP ‐ {LG}_{1, 1}

beam, RP beam, circularly polarized beam, and

x

-axis linearly polarized beam, respectively. The peak intensities have been normalized to one.

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Fig. 3. 2D intensity distributions of the (a)

P S F_{bright}

and (b)

P S F_{dark}

in the

x z

plane (

y = 0

). Axial profiles of the

P S F_{dark}

for different values of (c) NA and (d)

β_{0}

, respectively. (e) Axial profiles of the

P S F_{bright}

(red dashed line),

P S F_{dark}

(green dotted line), and

P S F_{sub}

(blue solid line) in the

z

axis. (f) Intensity distribution of the

P S F_{sub}

in the

x z

plane (

y = 0

).

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Fig. 4. Corresponding axial OTFs calculated for the

P S F_{bright}

(blue solid line) and

P S F_{sub}

(red dashed line) when the value of

γ

is 0.3.

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Fig. 5. Transverse intensity distributions in the focal plane when illuminated by (a)

RP ‐ {LG}_{1, 1}

beams and (b) circularly polarized beams, respectively. (c) Intensity distributions of the

P S F_{sub}

in the

x y

plane (

z = 0

). (d) The corresponding lateral profiles of intensity distributions along the

x

axis.

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Fig. 6. (a) 3D point array sample. (b) Cross section of the 3D sample in the

x z

plane.

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Fig. 7. (a) 3D image reconstruction of the point array sample with the

P S F_{bright}

. (b)

x z

slice and (c)

x y

slice of the image in (a). (d) 3D image reconstruction of the point array sample with the

P S F_{sub}

. (e)

x z

slice and (f)

x y

slice of the subtracted image in (d).

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References (32)

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Zhiyuan Gu, Xianghui Wang, Jianxin Wang, Fei Fan, Shengjiang Chang. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging[J]. Chinese Optics Letters, 2019, 17(12): 121103

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