Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging

Zhiyuan Gu; Xianghui Wang; Jianxin Wang; Fei Fan; Shengjiang Chang

doi:10.3788/COL201917.121103

Journals >Chinese Optics Letters >Volume 17 >Issue 12 >Page 121103 > Article

Chinese Optics Letters
Vol. 17, Issue 12, 121103 (2019)

Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging

Zhiyuan Gu, Xianghui Wang^*, Jianxin Wang, Fei Fan, and Shengjiang Chang

Author Affiliations

Institute of Modern Optics, Tianjin Key Laboratory of Optoelectronic Sensor and Sensing Network Technology, Nankai University, Tianjin 300350, China

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DOI: 10.3788/COL201917.121103 Cite this Article Set citation alerts

Zhiyuan Gu, Xianghui Wang, Jianxin Wang, Fei Fan, Shengjiang Chang. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging[J]. Chinese Optics Letters, 2019, 17(12): 121103 Copy Citation Text

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Abstract

Subtractive imaging is used to suppress the axial sidelobes and improve the axial resolution of 4pi microscopy with a higher-order radially polarized (RP) Laguerre–Gaussian (LG) beam. A solid-shaped point spread function (PSF) and a doughnut-shaped PSF with a dark spot along the optical axis are generated by tightly focusing a higher-order RP-LG beam and a modulated circularly polarized beam, respectively. By subtracting the two images obtained with those two different PSFs, the axial sidelobes of the subtracted PSF are reduced from 37% to about 10% of the main lobe, and the axial resolution is increased from 0.21