Stochastic collocation for device-level variability analysis in integrated photonics

Yufei Xing; Domenico Spina; Ang Li; Tom Dhaene; Wim Bogaerts

doi:10.1364/prj.4.000093

Journals >Photonics Research >Volume 4 >Issue 2 >Page 0093 > Article

Photonics Research
Vol. 4, Issue 2, 0093 (2016)

Stochastic collocation for device-level variability analysis in integrated photonics

Yufei Xing¹, Domenico Spina², Ang Li¹, Tom Dhaene², and Wim Bogaerts^1、3、*

Author Affiliations

¹Photonics Research Group, Department of Information Technology, Center for Nano and Biophotonics, Ghent University imec, Ghent B-9000, Belgium

²Department of Information Technology, Internet Based Communication Networks and Services (IBCN), Ghent University iMinds, Gaston Crommenlaan 8 Bus 201, B-9050 Gent, Belgium

³Luceda Photonics, 9200 Dendermonde, Belgium

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DOI: 10.1364/prj.4.000093 Cite this Article Set citation alerts

Yufei Xing, Domenico Spina, Ang Li, Tom Dhaene, Wim Bogaerts. Stochastic collocation for device-level variability analysis in integrated photonics[J]. Photonics Research, 2016, 4(2): 0093 Copy Citation Text

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Yufei Xing, Domenico Spina, Ang Li, Tom Dhaene, Wim Bogaerts. Stochastic collocation for device-level variability analysis in integrated photonics[J]. Photonics Research, 2016, 4(2): 0093

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