• Infrared and Laser Engineering
  • Vol. 51, Issue 4, 20210222 (2022)
Weijie Zhou1、2, Wenqiang Ma1、2, Rao Li1、2, Geyao Chu1、2, Baoan Song1、2, Shixun Dai1、2, Tiefeng Xu1、3, and Peiqing Zhang1、2
Author Affiliations
  • 1Laboratory of Infrared Materials and Devices, Faculty of Electrical and Engineering and Computer Science, Ningbo University, Ningbo 315211, China
  • 2Key Laboratory of Photoelectric Materials and Devices of Zhejiang Province, Ningbo 315211, China
  • 3Ningbo Institute of Oceanography, Ningbo 315832, China
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    DOI: 10.3788/IRLA20210222 Cite this Article
    Weijie Zhou, Wenqiang Ma, Rao Li, Geyao Chu, Baoan Song, Shixun Dai, Tiefeng Xu, Peiqing Zhang. Femtosecond laser damage characteristics of Ge-As-Se-Te chalcogenide glass[J]. Infrared and Laser Engineering, 2022, 51(4): 20210222 Copy Citation Text show less
    (a) Refractive index of the prepared chalcogenide glass(GexAs40−xSe40Te20,x=0, 10, 20, 30, 40) at 2-20 μm; (b) Absorption spectra of GexAs40−xSe40Te20 chalcogenide glass; (c) Tg of the glass as a function of Ge content
    Fig. 1. (a) Refractive index of the prepared chalcogenide glass(GexAs40−xSe40Te20,x=0, 10, 20, 30, 40) at 2-20 μm; (b) Absorption spectra of GexAs40−xSe40Te20 chalcogenide glass; (c) Tg of the glass as a function of Ge content
    (a) 2D optical microscope images at different average powers at 800 nm; (b) 3D mode; (c) LIDT linear fitting result at 800 nm
    Fig. 2. (a) 2D optical microscope images at different average powers at 800 nm; (b) 3D mode; (c) LIDT linear fitting result at 800 nm
    (a) 2D optical microscope images with different wavelengths and average powers; (b) 3D view; (c) SEM of damage morphology; (d) LIDT results with different wavelengths
    Fig. 3. (a) 2D optical microscope images with different wavelengths and average powers; (b) 3D view; (c) SEM of damage morphology; (d) LIDT results with different wavelengths
    (a) SEM image of damage morphology of different pulse numbers at 800 nm; (b) LIDT changes with the laser pulse number, illustrations for the logarithmic display
    Fig. 4. (a) SEM image of damage morphology of different pulse numbers at 800 nm; (b) LIDT changes with the laser pulse number, illustrations for the logarithmic display
    (a) Optical microscope image of damage by 800 nm femtosecond laser with different repetition frequencies; (b) Ge30As10Se40Te20 LIDT changes with different repetition frequencies from 1 Hz to 1 kHz
    Fig. 5. (a) Optical microscope image of damage by 800 nm femtosecond laser with different repetition frequencies; (b) Ge30As10Se40Te20 LIDT changes with different repetition frequencies from 1 Hz to 1 kHz
    (a) Raman spectra of GexAs40−xSe40Te20 glasses. The solid line is the original Raman spectrum,and dashed line is after femtosecond laser processing; (b) Deconvoluted Raman spectra of GexAs40-xSe40Te20 glasses
    Fig. 6. (a) Raman spectra of GexAs40−xSe40Te20 glasses. The solid line is the original Raman spectrum,and dashed line is after femtosecond laser processing; (b) Deconvoluted Raman spectra of GexAs40-xSe40Te20 glasses
    Weijie Zhou, Wenqiang Ma, Rao Li, Geyao Chu, Baoan Song, Shixun Dai, Tiefeng Xu, Peiqing Zhang. Femtosecond laser damage characteristics of Ge-As-Se-Te chalcogenide glass[J]. Infrared and Laser Engineering, 2022, 51(4): 20210222
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