• Infrared and Laser Engineering
  • Vol. 51, Issue 4, 20210222 (2022)
Weijie Zhou1、2, Wenqiang Ma1、2, Rao Li1、2, Geyao Chu1、2, Baoan Song1、2, Shixun Dai1、2, Tiefeng Xu1、3, and Peiqing Zhang1、2
Author Affiliations
  • 1Laboratory of Infrared Materials and Devices, Faculty of Electrical and Engineering and Computer Science, Ningbo University, Ningbo 315211, China
  • 2Key Laboratory of Photoelectric Materials and Devices of Zhejiang Province, Ningbo 315211, China
  • 3Ningbo Institute of Oceanography, Ningbo 315832, China
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    DOI: 10.3788/IRLA20210222 Cite this Article
    Weijie Zhou, Wenqiang Ma, Rao Li, Geyao Chu, Baoan Song, Shixun Dai, Tiefeng Xu, Peiqing Zhang. Femtosecond laser damage characteristics of Ge-As-Se-Te chalcogenide glass[J]. Infrared and Laser Engineering, 2022, 51(4): 20210222 Copy Citation Text show less

    Abstract

    Ge-As-Se-Te (GAST) chalcogenide glass has ultra-wide transmission range of more than 20 μm, an excellent optical material that can be applied in mid-infrared (MIR) and far-infrared (FIR). In this work, the GexAs40-xSe40Te20 (x=0, 10, 20, 30, 40 mol%) chalcogenide glasses were prepared by the fusion quenching method, and the optical properties were tested. The sample glass was irradiated with femtosecond lasers of different wavelengths (800 nm, 3 μm and 4 μm), different powers and repetition frequencies, and the laser damage characteristics of GAST were studied by scanning electron microscopy (SEM) and Raman spectroscopy. With the increase of Ge content, the laser-induced damage threshold (LIDT) at 800 nm reaches a maximum of 40.16 mJ/cm2 at Ge30As10Se40Te20. The LIDT increase with wavelength of the femtosecond laser and reaches 81.09 mJ/cm2 at 4 μm. In addition, the results show that LIDT will gradually decrease as the number of laser pulses and the repetition rate increase.
    Weijie Zhou, Wenqiang Ma, Rao Li, Geyao Chu, Baoan Song, Shixun Dai, Tiefeng Xu, Peiqing Zhang. Femtosecond laser damage characteristics of Ge-As-Se-Te chalcogenide glass[J]. Infrared and Laser Engineering, 2022, 51(4): 20210222
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