Damage characteristics of dual-band high reflectors affected by nodule defects in the femtosecond regime

Bin Ma; Jiaqi Han; Jing Li; Ke Wang; Shuang Guan; Xinshang Niu; Haoran Li; Jinlong Zhang; Hongfei Jiao; Xinbin Cheng; Zhanshan Wang

doi:10.3788/COL202119.081403

Journals >Chinese Optics Letters >Volume 19 >Issue 8 >Page 081403 > Article

Chinese Optics Letters
Vol. 19, Issue 8, 081403 (2021)

Damage characteristics of dual-band high reflectors affected by nodule defects in the femtosecond regime

Bin Ma^1、*, Jiaqi Han¹, Jing Li², Ke Wang¹, Shuang Guan¹, Xinshang Niu¹, Haoran Li¹, Jinlong Zhang¹, Hongfei Jiao¹, Xinbin Cheng¹, and Zhanshan Wang¹

Author Affiliations

¹Institute of Precision Optical Engineering, Tongji University, Shanghai 200092, China

²Beijing Research Institute of Telemetry, Beijing 100094, China

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DOI: 10.3788/COL202119.081403 Cite this Article Set citation alerts

Bin Ma, Jiaqi Han, Jing Li, Ke Wang, Shuang Guan, Xinshang Niu, Haoran Li, Jinlong Zhang, Hongfei Jiao, Xinbin Cheng, Zhanshan Wang. Damage characteristics of dual-band high reflectors affected by nodule defects in the femtosecond regime[J]. Chinese Optics Letters, 2021, 19(8): 081403 Copy Citation Text

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