• Chinese Optics Letters
  • Vol. 18, Issue 11, 113401 (2020)
Jun Shi1, Tong Yao2, Miao Li2、*, Guohong Yang3, Minxi Wei3, Wanli Shang3, and Feng Wang3
Author Affiliations
  • 1Key Laboratory of Optoelectronic Technology and Systems of the Ministry of Education, Chongqing University, Chongqing 400044, China
  • 2College of Optoelectronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, China
  • 3Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China
  • show less
    DOI: 10.3788/COL202018.113401 Cite this Article Set citation alerts
    Jun Shi, Tong Yao, Miao Li, Guohong Yang, Minxi Wei, Wanli Shang, Feng Wang. High efficiency X-ray diffraction diagnostic spectrometer with multi-curvature bent crystal[J]. Chinese Optics Letters, 2020, 18(11): 113401 Copy Citation Text show less
    References

    [1] B. Yu, J. M. Yang, T. X. Huang, P. Wang, W. L. Shang, X. M. Qiao, X. W. Deng, Z.W. Zhang, Z. F. Song, Q. Tang, X. S. Peng, J. B. Chen, Y. L. Li, W. Jiang, L. D. Pu, J. Yan, Z. J. Chen, Y. S. Dong, W. D. Zheng, F. Wang, S. E. Jiang, Y. K. Ding, J. Zheng. Chin. Phys. B, 28, 298(2019).

    [2] F. Wang, Z. Y. Guan, Y. L. Li, X. S. Peng, T. Xu, H. Y. Wei, X. M. Liu, W. Y. Zha, Y. G. Liu, Y. Mei. Sci. Sin. Phys. Mech. Astro., 48, 065205(2018).

    [3] Z. R. Cao, Z. Yuan, T. Chen, B. Deng, Q. Q. Wang, K. L. Deng, Z. W. Yang, J. Liu, W. Y. Miao, W. Jiang, Y. T. Yuan, Y. K. Li, X. Hu, J. Y. Zhang, J. J. Dong, Y. K. Ding, B. Z. Mu, F. Wang, S. Y. Liu, J. M. Yang, S. E. Jiang, B. H. Zhang. Sci. Sin. Phys. Mech. Astro., 48, 065206(2018).

    [4] Y. T. Deng, G. F. Jin, J. Zhu. Chin. Opt. Lett., 17, 092201(2019).

    [5] H. P. Zang, C. L. Zheng, Q. P. Fan, C. K. Wang, L. Wei, L. F. Cao, X. R. Wang, E. J. Liang. Chin. Opt. Lett., 16, 080501(2018).

    [6] J. Shi, G. H. Peng, S. L. Xiao, J. Y. Qian. Chin. J. Sci. Instrum., 12, 2761(2012).

    [7] A. A. Petrunin, A. E. Sovestnov, A. V. Tyunis, E. V. Fomin. Tech. Phys. Lett., 35, 73(2009).

    [8] A. P. Shevelko, Y. S. Kasyanov, O. F. Yakushev, L. V. Knight. Rev. Sci. Instr., 73, 3458(2002).

    [9] V. Hamos. Ann. Phys., 409, 716(1933).

    [10] A. P. Shevelko, A. A. Antonov, I. G. Grigorieva, Y. S. Kasyanov, L. V. Knight, A. R. Mena, C. Turner, Q. Wang, O. F. Yakushev. Proc. SPIE, 4144, 148(2000).

    [11] A. P. Shevelko. Proc. SPIE, 91, 3406(1998).

    [12] A. P. Shevelko, A. A. Antonov, I. G. Grigorieva, O. Yakushev, L. V. Knight, Q. Wang. Adv. X-ray Analysis, 45, 433(2002).

    [13] F. Zamponi, T. Kämpfer, A. Morak, I. Uschmann, E. Förster. Rev. Sci. Instrum., 76, 116101(2005).

    [14] T. A. Hall. J. Phys. E Sci. Instrum., 17, 110(1984).

    [15] M. Bitter, K. W. Hill, L. Gao, P. C. Efthimion, L. D. Apariccio, S. Lazerson, N. Pablant. Rev. Sci. Instrum., 87, 11E333(2016).

    [16] J. Shi, M. Bitter, K. W. Hill, L. Gao, J. Ma, S. Miao. Rev. Sci. Instrum., 88, 123116(2017).

    [17] U Andiel, K Eidmann, F. Pisani, K. Witte, I. Uschmann, O. Wehrhan, E. Förster. Rev. Sci. Instrum., 74, 2369(2003).

    [18] X. H. Yuan, D. C. Carroll, M. Coury, R. J. Gray, C. M. Brenner, X. X. Lin, Y. T. Li, M. N. Quinn, O. Tresca, B. Zielbauer, D. Neely, P. McKenna. Phys. Res. A, 653, 145(2011).

    CLP Journals

    [1] Ke Li, Yantao Gao, Haipeng Zhang, Guohao Du, Hefei Huang, Hongjie Xu, Tiqiao Xiao. Efficient three-dimensional characterization of C/C composite reinforced with densely distributed fibers via X-ray phase-contrast microtomography[J]. Chinese Optics Letters, 2021, 19(7): 073401

    Data from CrossRef

    [1] Zhe Wang, Lingqi Wu, Yuanyuan Fang, Aihuan Dun, Jiaoling Zhao, Xueke Xu, Xiaolei Zhu. Application of Flow Field Analysis in Ion Beam Figuring for Ultra-Smooth Machining of Monocrystalline Silicon Mirror. Micromachines, 13, 318(2022).

    Jun Shi, Tong Yao, Miao Li, Guohong Yang, Minxi Wei, Wanli Shang, Feng Wang. High efficiency X-ray diffraction diagnostic spectrometer with multi-curvature bent crystal[J]. Chinese Optics Letters, 2020, 18(11): 113401
    Download Citation