Jun Shi, Tong Yao, Miao Li, Guohong Yang, Minxi Wei, Wanli Shang, Feng Wang. High efficiency X-ray diffraction diagnostic spectrometer with multi-curvature bent crystal[J]. Chinese Optics Letters, 2020, 18(11): 113401
- Chinese Optics Letters
- Vol. 18, Issue 11, 113401 (2020)
Fig. 1. Principle diagram of the conical crystal spectrometer.
Fig. 2. Principle diagram of the multi-curvature analyzer.
Fig. 3. X-ray path in the XOZ plane with deviation of reflection point.
Fig. 4. Schematic of the reflection point moving along negative Z axis.
Fig. 5. Fabricated multi-curvature
Fig. 6. Schematic of the source, bent crystal, and detector.
Fig. 7. X-ray spectrum obtained from the (a) multi-curvature crystal and (b) the planar
Fig. 8. Distribution of spectral intensity: (a) multi-curvature bent
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