• Acta Optica Sinica
  • Vol. 41, Issue 7, 0729001 (2021)
Changming Wang and Wanrong Gao*
Author Affiliations
  • School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing, Jiangsu 210094, China
  • show less
    DOI: 10.3788/AOS202141.0729001 Cite this Article Set citation alerts
    Changming Wang, Wanrong Gao. Measurement of Scattering Coefficient of Glass Subsurface Defects Based on Micron SDOCT[J]. Acta Optica Sinica, 2021, 41(7): 0729001 Copy Citation Text show less

    Abstract

    A micron spectral domain optical coherence tomography (SDOCT) system built by us is used to conduct depth resolution, noncontact, and nondestructive measurement of glass subsurface defects. In addition, a single scattering model is used to calculate the obtained tomographic images, and obtain the glass scattering coefficient of glass subsurface defects. The experimental results revealed that the use of scattering coefficient is effective in distinguishing damage structures at different depths on the glass subsurface. The depth resolution measurement of the glass subsurface scattering coefficient is beneficial to the analysis of the optical characteristics of glass subsurface defects, and is essential for the processing and testing of precision optical components.
    Changming Wang, Wanrong Gao. Measurement of Scattering Coefficient of Glass Subsurface Defects Based on Micron SDOCT[J]. Acta Optica Sinica, 2021, 41(7): 0729001
    Download Citation