Detection Efficiency Measurement of Silicon Single-photon Avalanche Detector Traceable Using Standard Detector

Chang-ming LIU; Xue-shun SHI; Peng-ju ZHANG; Xin-gang ZHUANG; Hong-bo LIU

doi:10.3788/gzxb20194812.1248006

Journals >Acta Photonica Sinica >Volume 48 >Issue 12 >Page 1248006 > Article

Acta Photonica Sinica
Vol. 48, Issue 12, 1248006 (2019)

Detection Efficiency Measurement of Silicon Single-photon Avalanche Detector Traceable Using Standard Detector

Chang-ming LIU^{1、1、2、2}, Xue-shun SHI^{1、1、2、2、*}, Peng-ju ZHANG^{1、1、2、2}, Xin-gang ZHUANG^{1、1、2、2}, and Hong-bo LIU^{1、1、2、2}

Author Affiliations

¹The 41 st Research Institute of China Electronic Science and Technology Group, Qingdao, Shandong 266555, China

²National Opto-Electronic Primary Metrology Laboratory, Qingdao, Shandong 266555, China

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DOI: 10.3788/gzxb20194812.1248006 Cite this Article

Chang-ming LIU, Xue-shun SHI, Peng-ju ZHANG, Xin-gang ZHUANG, Hong-bo LIU. Detection Efficiency Measurement of Silicon Single-photon Avalanche Detector Traceable Using Standard Detector[J]. Acta Photonica Sinica, 2019, 48(12): 1248006 Copy Citation Text

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Fig. 1. Si-SPAD探测效率测量装置示意图Schematic setup for the detection efficiency measurement of Si-SPAD

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Fig. 2. Si-SPAD后脉冲概率测量装置原理图Schematic diagram for the afterpulse probability of Si-SPAD

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Fig. 3. Si-SPAD死时间分布Dead time distribution of Si-SPAD

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Year	Uncertainty(k=1)	Wavelength/nm	Measurement of additional parameters	Reference
2000	~1%	632.8	Dead time	^[1]
2005	6.8%	632.8	Dead time	^[3]
2007	0.17%	702	Dead time and afterpulsing	^[5]
2015	0.31%	770	Dead time	^[8]
2016	0.16%	770	/	^[9]
This work	0.3%	632.8	Dead time and afterpulsing	/

Table 1. Detection efficiency measurement of Si-APD using standard detector

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Source of uncertainty	Relative uncertainty of value/%	Sensitivity coefficient	Contribution/%
Type AType B	0.10	1	0.10
Total counting	0.15	1.007	0.151
Noise counting	4	0.008	0.032
Afterpulsing probability	10	0.005	0.05
Dead time	3	0.017	0.051
Voltage measurement	0.08	1	0.08
Amplifiers gain calibration	0.16	1	0.16
Power correction	0.09	1	0.09
Objective transmittance	0.05	1	0.05
Wavelength	0.06	1	0.06
Spectral responsivity@632.8 nm	0.05	1	0.05
Combined standard uncertainty			0.30
Expanded uncertainty (k=2)			0.6

Table 2. Measurement uncertainty budget

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