An experimental facility designed for the detection efficiency mesaurement of silicon single-photon avalanche detector traceable using standard detector is described. The photon rate is determined from the standard detector and a large dynamic range attenuation technique. Furthermore, the afterpulsing probability and dead time are considered and meaured. The component uncertainties associated with the measurement of detection efficiency are analyzed. The obtained expanded measurement uncertainty is 0.6% (k=2). Combining the monochromatic source consisted of supercontinuum laser and monochromator, the detection efficiency of silicon single-photon avalanche photodiodes could be automatic measured in a broad wavelength range using the standard detector in the setup.