• Acta Optica Sinica
  • Vol. 19, Issue 6, 785 (1999)
[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Approach of Near-Field Diffraction Patterns by the Sampling Theorem[J]. Acta Optica Sinica, 1999, 19(6): 785 Copy Citation Text show less
    References

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    [2] Zenhausern F, boyle M P, Wickramasinghe H K. Apertureless near-field optical microscope. Appl. Phys. Lett., 1994, 65(13):1623~1625

    [3] Massey G A. Microscopy and pattern generation with scanning evanescent waves. Appl. Opt., 1984, 23(5):658~660

    [4] Rudduck R C, Chen C L J. New plane wave spectrum formulations for the near-fields of circular and strip apertures. IEEE Transactions on Antennas and Propagation, 1976, Ap-24(4):438~449

    [5] Kowarz M W. Homogeneous and evanescent contributions in scalar near-field diffraction. Appl. Opt., 1995, 34(17):3055~3063

    [6] Depasse F, Paesler M A, Courjon D et al.. Hygens-fresnel principle in the near field. Opt. Lett., 1995, 20(3):234~236

    [7] Betzig E, Harootunian A, Lewis A et al.. Near-field diffraction by a slit: Implications for superresolution microscopy. Appl. Opt., 1986, 25(12):1890~1900

    [8] Roberts A. Electromagnetic theory of diffraction by a circular aperture in a thick, perfectly conducting screen. J. Opt. Soc. Am (A), 1987, 4(10):1970~1983

    [10] Massey G A, Davis J A, Katnik S M et al.. Subwavelength resolution far-infrared micrescopy. Appl. Opt., 1985, 24(10):1498~1501

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Approach of Near-Field Diffraction Patterns by the Sampling Theorem[J]. Acta Optica Sinica, 1999, 19(6): 785
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