Degradation mechanism of star sensor performance caused by radiation damage of CMOS image sensor

Jie Feng; Yudong Li; Lin Wen; Qi Guo

doi:10.3788/IRLA20190555

Journals >Infrared and Laser Engineering >Volume 49 >Issue 5 >Page 20190555 > Article

Infrared and Laser Engineering
Vol. 49, Issue 5, 20190555 (2020)

Degradation mechanism of star sensor performance caused by radiation damage of CMOS image sensor

Jie Feng, Yudong Li, Lin Wen, and Qi Guo

Author Affiliations

Laboratory of Solid State Radiation Physics, Xinjiang Technical Institute of Physics and Chemistry of Chinese Academy of Sciences, Urumqi 830011, China

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DOI: 10.3788/IRLA20190555 Cite this Article

Jie Feng, Yudong Li, Lin Wen, Qi Guo. Degradation mechanism of star sensor performance caused by radiation damage of CMOS image sensor[J]. Infrared and Laser Engineering, 2020, 49(5): 20190555 Copy Citation Text

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References

CLP Journals

[1] Xi Wang, Nanxiang Zhao, Yongning Zhang, Biyi Wang, Xiao Dong, Yan Zou, Wuhu Lei, Yihua Hu. Irradiation effect of 2.79 μm mid-infrared laser on CMOS image sensor[J]. Infrared and Laser Engineering, 2023, 52(6): 20230168

[2] Jiawei Chen, Yudong Li, Liya Ma, Yu Li, Qi Guo. Radiation effect of 850 nm vertical-cavity surface-emitting laser[J]. Infrared and Laser Engineering, 2022, 51(5): 20210326

Jie Feng, Yudong Li, Lin Wen, Qi Guo. Degradation mechanism of star sensor performance caused by radiation damage of CMOS image sensor[J]. Infrared and Laser Engineering, 2020, 49(5): 20190555

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