[1] T. Liu, P. Wang, H. Zhang. Chin. Opt. Lett., 13, 040601(2015).
[2] Z. Alaie, S. M. Nejad, M. H. Yousefi. Mater. Sci. Semicond. Process., 29, 16(2015).
[7] F. Yan, Y. Luo, J. H. Zhao, G. H. Olsen. Electron. Lett., 35, 929(1999).
[8] H.-D. Liu, X. Guo, D. McIntosh, J. C. Campbell. IEEE Photon. Technol. Lett., 18, 2508(2006).
[12] Q. Zhou, D. McIntosh, H.-D. Liu, J. C. Campbell. IEEE Photon. Technol. Lett., 23, 299(2011).
[14] A. Vert, S. Soloviev, J. Fronheiser, P. Sandvik. IEEE Photon. Technol. Lett., 20, 1587(2008).
[15] X. Zhou, J. Li, W. Lu, X. Song, S. Yin, Y. Wang, X. Tan, Y. Lv, Z. Feng. IEEE International Conference on Electron Devices and Solid State Circuits(2018).
[20] H.-Y. Cha, S. Soloviev, S. Zelakiewicz, P. Waldrab, P. M. Sandvik. Sens. J., 8, 233237(2008).