• Chinese Optics Letters
  • Vol. 17, Issue 9, 090401 (2019)
Xingye Zhou, Xin Tan, Yuangang Wang, Xubo Song, Tingting Han, Jia Li, Weili Lu, Guodong Gu, Shixiong Liang, Yuanjie Lü*, and Zhihong Feng**
Author Affiliations
  • National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051, China
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    DOI: 10.3788/COL201917.090401 Cite this Article Set citation alerts
    Xingye Zhou, Xin Tan, Yuangang Wang, Xubo Song, Tingting Han, Jia Li, Weili Lu, Guodong Gu, Shixiong Liang, Yuanjie Lü, Zhihong Feng. High-performance 4H-SiC p-i-n ultraviolet avalanche photodiodes with large active area[J]. Chinese Optics Letters, 2019, 17(9): 090401 Copy Citation Text show less
    (a) Schematic structure of the large-area 4H-SiC p-i-n UV APD, where the drawing is not to scale; (b) the top-view image of one fabricated 4H-SiC APD with 800 μm diameter; (c) profile of the beveled mesa with an angle of 8°.
    Fig. 1. (a) Schematic structure of the large-area 4H-SiC p-i-n UV APD, where the drawing is not to scale; (b) the top-view image of one fabricated 4H-SiC APD with 800 μm diameter; (c) profile of the beveled mesa with an angle of 8°.
    (a) Dark current of fabricated APDs with various sizes; (b) dark current as a function of device diameter at the reverse voltages of 160 V and 170 V.
    Fig. 2. (a) Dark current of fabricated APDs with various sizes; (b) dark current as a function of device diameter at the reverse voltages of 160 V and 170 V.
    UV detection performance of 800 μm diameter 4H-SiC p-i-n APD: (a) I–V measurement results; (b) spectral response characteristics.
    Fig. 3. UV detection performance of 800 μm diameter 4H-SiC p-i-n APD: (a) IV measurement results; (b) spectral response characteristics.
    Comparison of our large-area 4H-SiC p-i-n APD with the results of others’ work.
    Fig. 4. Comparison of our large-area 4H-SiC p-i-n APD with the results of others’ work.
    UV imaging measurement of our fabricated 4H-SiC p-i-n APD: (a) schematic diagram of the experimental setup; (b) UV photo image of HSRI logo obtained by our 4H-SiC APD-based UV detector.
    Fig. 5. UV imaging measurement of our fabricated 4H-SiC p-i-n APD: (a) schematic diagram of the experimental setup; (b) UV photo image of HSRI logo obtained by our 4H-SiC APD-based UV detector.
    Xingye Zhou, Xin Tan, Yuangang Wang, Xubo Song, Tingting Han, Jia Li, Weili Lu, Guodong Gu, Shixiong Liang, Yuanjie Lü, Zhihong Feng. High-performance 4H-SiC p-i-n ultraviolet avalanche photodiodes with large active area[J]. Chinese Optics Letters, 2019, 17(9): 090401
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