• Acta Optica Sinica
  • Vol. 24, Issue 4, 548 (2004)
[in Chinese]*, [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese]. Analysis of Interdigital Electrooptic Bragg Diffraction Grating[J]. Acta Optica Sinica, 2004, 24(4): 548 Copy Citation Text show less
    References

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    [2] Auracher F. Planar Electrooptic and Acoustooptic Bragg-Deflectors. Integrated Optics Physics and Applications. New York and London: Plenum Press, 1983. 211~223

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    [9] Kosslowski S, Bogelsack F, Wolff I. The application of the point-matching method to the analysis of microstrip lines with finite metallization thickness. IEEE Trans. Microwave Theory Technol., 1988, 36(8):1265~1271

    [10] Zhu N H, Qiu W, Pun E Y B. Analysis of velocity-matched Ti∶LiNbO3 optical intensity modulators with an extended point-matching method. Opt. Quantum Electron., 1996, 28:137~146

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    [in Chinese], [in Chinese], [in Chinese]. Analysis of Interdigital Electrooptic Bragg Diffraction Grating[J]. Acta Optica Sinica, 2004, 24(4): 548
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