Author Affiliations
1 Laboratory of Thin Film Optics, Shanghai Institute of Optics and Fine Mechanics, Shanghai 201800, China2 Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China3 Key Laboratory of Materials for High Power Laser, Chinese Academy of Sciences, Shanghai 201800, China4 State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, Chinashow less
Fig. 1. Schematic of magnetic-dipole moment excited in all-dielectric nanoparticles[35]
Fig. 2. Spectral dependence properties of crystalline silicon at room temperature[36]. (a) Real and imaginary parts of refractive index; (b) ratio between electrical conduction current and displacement current
Fig. 3. Electric field distributions in nanoparticles under different conditions. (a) MD resonance; (b) ED resonance
Fig. 4. Examples of high-index dielectric nanoparticles fabricated by lithography. (a) Scanning electron microscopy (SEM) image of hollow Si cylinder[38]; (b) Si nanoparticles obtained by means of reactive-ion-etching based on mask[39]; (c) Si nanoparticles with additionally deposited Si3N4 thin film[40]
Fig. 5. SEM images of Si colloids and Si nanoparticles. (a) High-magnification SEM images of silicon colloids [41]; (b) self-aligned silicon nanoparticles obtained by chemical deposition[43]
Fig. 6. Dark-field optical image of Si nanoparticles and atomic force microscope (AFM) image of SiGe nanoparticles. (a) Dark-field optical image of Si nanoparticles obtained by thin film dewetting[44]; (b) AFM image of SiGe nanoparticles in array received after thermal dewetting[46]
Fig. 7. Examples of high-index dielectric nanoparticles fabricated by laser ablation method. (a) Dark-field optical image of silicon nanoparticle obtained via femtosecond laser ablation of bulk silicon[47]; (b) transmission electron microscope (TEM) image of ZnO submicrosphere[48]; (c) TEM image of CdSe submicrosphere[48]
Fig. 8. Examples of silicon nanoparticles fabricated by LIT method[50]. (a) Array of amorphous Si nanoparticles fabricated by LIT method and visualized with dark-field microscopy; (b) femtosecond laser printed Si nanoparticles
Fig. 9. Resonant characteristics of nano-resonators with high index semiconductor materials. (a) Cubic, spherical or disc-shaped resonators composed of high-index dielectric[52]; (b) effective negative magnetic permeability μeff and e?ective negative dielectric permittivity εeff52; (c) reflection and transmission spectra of two-dimensional arrays of tellurium resonators near electric or magnetic resonance[21]
Fig. 10. Wavelength dependence of directivity of two types of all-dielectric nano-antennas[67]. (a) Single dielectric nanoparticle; (b) Yagi-Uda-type structure when separation distance D is 70 nm
Fig. 11. Maximum directivity of super-directive nano-antenna versus position of dipole source at wavelength of 455 nm[68]
Fig. 12. Several common metamaterial structures. (a)(b) All-dielectric metamaterial based on spherical and cylindrical particles[77] ; (c)-(f) all-dielectric metasurfaces[78,57,40]
Fig. 13. Spectrum for third harmonic generation (THG) of Si nanodisk array and directionality of Si nano-antenna. (a) THG spectrum of nanodisk array(purple dots)and linear transmission spectrum (gray area) [26]; (b)dynamical reconfiguration of Si nano-antenna directivity via photoexcitation, and scattering diagrams of incident beam at largest intensity shown in two insets[29]