• Acta Optica Sinica
  • Vol. 19, Issue 6, 800 (1999)
[in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese]. Effects of Roughness on Characterization of Soft X-Ray Multilayer Coating[J]. Acta Optica Sinica, 1999, 19(6): 800 Copy Citation Text show less
    References

    [1] Stearns D G, Rosen R S, Vernon S P. Multilayer mirror technology for soft X-ray projection lithography. Appl. Opt., 1993, 32(34):6952~6960

    [2] Henke B L, Lee P, Tanaka T J et al.. The atomic scattering factor, f1+if2, for 94 elements and for the 100 to 2000 eV photon energy region. AIP Conference Proceedings, 1981, (75):340~388

    [3] Michette A G. Optical Systems for Soft X Rays. New York: Plenum Press, 1986.

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    [in Chinese], [in Chinese], [in Chinese]. Effects of Roughness on Characterization of Soft X-Ray Multilayer Coating[J]. Acta Optica Sinica, 1999, 19(6): 800
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