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    Journals >Opto-Electronic Engineering >Volume 32 >Issue 9 >Page 43 > Article
    • Opto-Electronic Engineering
    • Vol. 32, Issue 9, 43 (2005)
    New depth recovery algorithm in modulation measurement profilometry
    [in Chinese]1、2 and [in Chinese]1
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese]. New depth recovery algorithm in modulation measurement profilometry[J]. Opto-Electronic Engineering, 2005, 32(9): 43 Copy Citation Text show less
    References

    [1] Mitsuo TAKEDA,Kazuhiro MUTOH. Fourier transform profilometry for the automatic measurement of 3-D object shapes[J].Applied Optics,1983,22(24):3977-3982.

    [2] V. SRINIVASAN,H. C. LIU,Maurice HALIOUA. Automated phase-measuring profilometry:a phase mapping approach[J]. Applied Optics,1985,24(2):185-188.

    [5] Likun SU,Xianyu SU,Wangsong LI,et al. Application of modulation measurement profilometry to objects with surface holes[J]. Applied Optics,1999,38(7):1153-1158.

    [6] Xian-Yu SU,Li-Kun SU,Wansong LI. A new Fourier transform profilometry based on modulation measurement[J]. SPIE,1999,3749:438-439.

    [7] Shree K. NAYAR,Yasuo NAKAGAWA. Shape from focus[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence,1994,16(8):824-831.

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    [in Chinese], [in Chinese]. New depth recovery algorithm in modulation measurement profilometry[J]. Opto-Electronic Engineering, 2005, 32(9): 43
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