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    Journals >Opto-Electronic Engineering >Volume 32 >Issue 9 >Page 43 > Article
    • Opto-Electronic Engineering
    • Vol. 32, Issue 9, 43 (2005)
    New depth recovery algorithm in modulation measurement profilometry
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    DOI: Cite this Article
    [in Chinese], [in Chinese]. New depth recovery algorithm in modulation measurement profilometry[J]. Opto-Electronic Engineering, 2005, 32(9): 43 Copy Citation Text show less

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    [in Chinese], [in Chinese]. New depth recovery algorithm in modulation measurement profilometry[J]. Opto-Electronic Engineering, 2005, 32(9): 43
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