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    Journals >Acta Optica Sinica >Volume 15 >Issue 9 >Page 1258 > Article
    • Acta Optica Sinica
    • Vol. 15, Issue 9, 1258 (1995)
    Precision Analysis of Phase-Modulation Method for Measuring Stress Birefringence of Optical-Disk Substrate
    [in Chinese], [in Chinese], and [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese]. Precision Analysis of Phase-Modulation Method for Measuring Stress Birefringence of Optical-Disk Substrate[J]. Acta Optica Sinica, 1995, 15(9): 1258 Copy Citation Text show less
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    [in Chinese], [in Chinese], [in Chinese]. Precision Analysis of Phase-Modulation Method for Measuring Stress Birefringence of Optical-Disk Substrate[J]. Acta Optica Sinica, 1995, 15(9): 1258
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