In this report, the processes of texture formation in grain-oriented ferroelectric ceramics based on layer-structured ferroelectric Bi₄Ti₃O₂ (LSBT) prepared by hot forging method are considered. The microstructural and X-ray methods revealed the axial textured formation in ferroelectric ceramic that are used to estimate the orientation factor of ceramics. For the first time, the domain structure changes when poling the anisotropic ferroelectric ceramics are investigated. The anisotropy of electromechanical, piezoelectric and ferroelectric properties of ferroelectric ceramics due to the crystal texture existence in it is studied. The aim of this study is to study the processes of crystalline texture formation in polycrystalline BLSF and to establish the dependence of the electrophysical properties of ceramics on the degree of texturing. Ceramics were textured using the hot stamping (HS) method developed at the Research Institute of Physics. The mechanism of the method is that the workpiece is subjected to uniaxial pressure and free radial deformation occurs due to the plastic flow of the material until the workpiece fills the free volume of the mold, which is created by placing the workpiece in the mold with a gap. The study of the microstructure of ceramics showed that an increase in the firing temperature in the range 950–1050${}^{\circ }$C causes a sharp decrease in porosity and increases the density to 7.95 g/${\mathrm{\text{cm}}}^3$, which is 98% of theoretical. An X-ray analysis was performed and microstructural studies were carried out, which revealed the formation of an axial texture in ceramics. The features of the switching processes of textured ceramics are revealed. The characteristics of the polarization switching of ceramics in the directions parallel and perpendicular ($\perp$) of the pressure axis during hot processing were obtained from the dielectric hysteresis $P$($E$) loops, i.e., axis axial texture. The $\perp$-cut ceramics are characterized by a more complete polarization switching, which is associated with the additional orientation of the (001) crystallographic planes in the textured material, as well as the presence of a threshold switching field. In the temperature range from -196 to + 600${}^{\circ }$C, the anisotropy of the electro physical properties of ceramics due to the presence of a crystalline texture in it was studied. The dielectric constant, electrical conductivity, piezoelectric and elastic coefficients were measured for sections of ceramics of different orientations relative to the axis of the texture. The anisotropy of the dielectric constant and electrical conductivity manifests itself weakly at room temperature and increases sharply when approaching the Curie temperature. In the temperature range +20–400${}^{\circ }$C, the high thermal stability of the piezoelectric module $d_{33}$, measured by the quasistatic method, was established.